Hi, I’m Henok Shiferaw, a Patent Examiner
I graduated with a Bachelors Science in Manufacturing Engineering/System, a Masters in Computational Science and Engineering from North Carolina A&T State University in 2012 and PhD candidate in Computational Science and Engineering in North Carolina A&t State University.
I now work at USPTO as a Primary Patent Examiner in Electrical/Computer Engineering to evaluate patent applications in the NetworkPrinting, Scanning, Color, Halftone, Image Analysis, Data Compression, Data Analysis, Data Encryption, Barcode Symbology, FAX/PRINTER/SCANNER Technology and Display System arts for compliance with federal patent laws and regulations.